Fab Overview
Live status of every lot on the line: defect rate, dominant pattern and drift alarms.
Lots
Pattern sequence in test order · click a lot for details| Lot | Tool | Status | Defect rate | Dominant pattern | Sequence · 25 wafers | |
|---|---|---|---|---|---|---|
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Active drift alarms
requires engineering attentionDefect pattern distribution
all lotsLot Monitor
Replays a lot in test order. A drift alarm fires when the same defect appears on at least 3 of the last 5 wafers.
Select a lot to replay
Each wafer is classified in the order it was tested; the first wafer that triggers a drift alarm receives a full root-cause analysis and a cost recommendation.
Wafer Inspection
CNN classification, out-of-distribution check, similar historical cases, drift context and AI root-cause analysis.
Select a wafer to inspect
Pick a wafer from a lot, an index from the 30k-wafer history, or upload your own wafer map.
Upload Wafers
Bring your own wafer maps. Files are validated on the server and previewed here; then inspect a single wafer or replay them all as a lot with drift detection and a cost decision.
Supported formats
Encoding: 0 = no die (background) · 1 = pass die · 2 = fail die. Any grid size; maps are resized to 64 × 64.
A 2-D array, {"wafer": [[…]]}, a list of those, or {"wafers": [{"wafer_id": "W1", "wafer": [[…]]}, …]}.
One row per line, values separated by commas, spaces or tabs. Several wafers: separate blocks with a blank line; a line like # W1 names the next wafer.
A 2-D array (one wafer) or a 3-D stack (N, H, W). Pickled object arrays are rejected.
A rendered wafer map in three colours. Background is taken from the image border, the warmer colour is read as fail. Always check the preview.
Review Log
Engineer confirmations and corrections of model predictions.
| ID | Timestamp | Wafer | Predicted | Review | Correct class | Comment |
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